Tianjin Gangdong Technology Co., Ltd
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SGM-2 Michelson and Fabry Perot dual-purpose interferometer
Interference, diffraction, and polarization
Product details

-Instrument Introduction

Observe various interference phenomena: equal tilt interference, equal thickness interference, white light interference; Measure the wavelength of monochromatic light, thickness of transparent medium film, coating thickness, and refractive index of air; Fabry Perot interferometer, observing multiple beam interference sharp rings, measuring wavelength differences between adjacent spectral lines, and observing the fine structure of spectral lines.


-Experimental content

1. Observe various interference phenomena: equal tilt interference, equal thickness interference, white light interference (optional accessory: dual-purpose sodium and tungsten lamp)

2. Measure the wavelength of monochromatic light, thickness of transparent medium film, coating thickness, and refractive index of air (optional attachments: chamber, barometer, and meter head)

3. Fabry Perot interferometer, observing multiple beam interference sharp rings, measuring wavelength differences between adjacent spectral lines, observing fine structures of spectral lines


-Basic configuration and parameters

SGM-2 迈克耳逊和法布里—珀罗两用干涉仪

-Optional configuration

SGM-2 迈克耳逊和法布里—珀罗两用干涉仪

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Successful operation!

Successful operation!

Successful operation!